In cooperation with Radiant Technologies USA, Incienta offers innovative and advanced characterization equipment for non-linear electromechanical testing, MEMS, non-volatile memory technologies and actuators/sensors. Radiant pioneered and developed the first ferroelectric test system which quickly became the world-wide industry standard for characterizing non-linear materials. Precision and accuracy has been the driving force behind the engineering of our test equipment and thin ferroelectric film components. Radiant designs its testers to minimize distortion and maximize accuracy.
Vision Data Management Software drives Radiant's test systems. Vision Software allows researchers the simplicity, power and flexibility to take experiments to the next level. Vision offers 155 Tasks in Total. Vision is the only software package available for ferroelectric testers that provides exceptional freedom to design, conduct and review all procedures associated with any material experiment. Vision Software dramatically increases the productivity of the researcher, reducing the time required to acquire data in an experiment. Vision’s enhanced productivity directly reduces cost of test.
Radiant offers a wide range of Precision Non-Linear Test Systems (PiezoMEMS Analyzer, Multiferroic II, Premier II, LCII and RT66C) for material research, development and device qualification. Precision Test Systems vary by Frequency, Sample Area and Voltage (see Precision Tester Comparison Chart Below).
Tester Parameter |
Premier II |
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Voltage Range (built-in drive voltage) |
±10V, ±30V, ±100V, ±200V or ±500V built-in |
±200V |
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Voltage Range with an external amplifier and high voltage interface (HVI) |
10KV |
10KV |
10KV |
10KV |
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Number of ADC Bits |
18 |
18 |
18 |
14 |
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Minimum Charge Resolution |
0.80fC |
0.80fC |
<10fC |
122fC |
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Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) |
0.080μ2 |
0.080μ2 |
<1μ2 |
12.2μ2 |
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Maximum Charge Resolution |
5.26mC |
5.26mC |
276μC |
4.8μC |
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Maximum Area Resolution (assuming saturation polarization = |
52.6cm2 |
52.6cm2 |
2.76cm2 |
4.8mm2 |
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Maximum Charge Resolution with High Voltage Interface (HVI) |
526mC |
526mC |
27.6mC |
480μC |
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Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI |
>100cm2 |
>100cm2 |
>100cm2 |
4.8cm2 |
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Maximum Hysteresis Frequency |
250KHz @ 10V |
5KHz @ 10V |
1KHz |
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50KHz @ 30V |
5KHz @ 30V |
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270KHz @ 100V |
50KHz @ 100V |
5KHz @ 100V |
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|
|
100KHz @ 200V |
50KHz @ 200V |
5KHz @ 200V |
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5KHz @ 500V |
2KHz @ 500V |
2KHz @ 500V |
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Minimum Hysteresis Frequency |
0.03Hz |
0.03Hz |
0.03Hz |
1/8th Hz |
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Minimum Pulse Width |
0.5μs |
0.5μs |
50μs |
500μs |
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Minimum Pulse Rise Time (5V) |
400ns |
400ns |
40μs |
500μs |
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Maximum Pulse Width |
1s |
1s |
1s |
100ms |
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Maximum Delay between Pulses |
40ks |
40ks |
40ks |
40ks |
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Internal Clock |
25ns |
25ns |
25ns |
50μs |
|
Minimum Leakage Current (assuming max current integration period = 1 seconds) |
1pA |
1pA |
1pA |
10pA |
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Maximum Small Signal Cap Frequency |
1MHz |
1MHz |
20KHz |
2KHz |
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Minimum Small Signal Cap Frequency |
1Hz |
1Hz |
1Hz |
10Hz |
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Output Rise Time Control |
105 scaling |
105 scaling |
103 scaling |
2 settings |
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Input Capacitance |
-6fF |
-6fF |
-6fF |
1pF |
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Electrometer Input All Test Frequencies for all test at any speed |
Yes |
Yes |
Yes |
Yes |
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*** Tester specifications are subject to change without notice. |
High Voltage Testing Accessories
→ High Voltage Interface
→ High Voltage Test Fixtures
→ High Voltage Amplifiers
→ Thin Film Piezoelectric Test Bundles
→ Precision Nano Displacement Sensor
→ Heated D33 Bulk Ceramic Piezo / Pyroelectric Test Bundle
→ Bulk Ceramic D33 Piezoelectric Test Bundle